High precision electrical resistivity (&rgr;) measurements are carried out on amorphous Fe80−xNixB20(x=20, 40, 50, and 60) alloys in the temperature range 5 to 750 K. All the samples show a minimum in resistivity (&rgr;min) and the temperature (Tmin), at which &rgr;minoccurs, lies in the temperature range 10–15 K. ForT<Tmin, &rgr; shows logarithmic temperature dependence and aboveTmin , &rgr; varies quadratically with temperature. Measurement of Curie (Tc) and crystallization (Tx) temperatures precedes Curie temperature and for other samplesTcvalue decreases with increasing Ni concentration. A detailed data analysis, carried out in the light of existing theories with emphasis to magnetic contribution to total resistivity in these alloys, is presented and compared with the earlier results.