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Single Crystal CuInSe2Analysis by High Resolution XPS

 

作者: P. E. Sobol,   A. J. Nelson,   C. R. Schwerdtfeger,   W. F. Stickle,   J. F. Moulder,  

 

期刊: Surface Science Spectra  （AIP Available online 1992）
卷期: Volume 1, issue 4  

页码: 393-397

 

ISSN:1055-5269

 

年代: 1992

 

DOI:10.1116/1.1247638

 

出版商: American Vacuum Society

 

关键词: COPPER SELENIDES;INDIUM SELENIDES;TERNARY COMPOUNDS;PHOTOELECTRON SPECTROSCOPY;X RADIATION;OPTICAL MATERIALS;MONOCRYSTALS

 

数据来源: AIP

 

摘要:

Copper indium selenide (CIS) is a material commonly used in photovoltaic devices. High resolution XPS spectra are obtained from a freshly fractured single crystal CIS sample. Spectra include Cu 2p, In 3d and Se 3d core lines along with valence band and survey spectra.

 

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