A SiC JFET amplifier for operation in high temperature and high radiation environments
作者:
James M. McGarrity,
Charles J. Scozzie,
James Blackburn,
Bruce Geil,
W. Merle DeLancey,
期刊:
AIP Conference Proceedings
(AIP Available online 1995)
卷期:
Volume 324,
issue 1
页码: 33-38
ISSN:0094-243X
年代: 1995
DOI:10.1063/1.47186
出版商: AIP
数据来源: AIP
摘要:
A SiC high temperature amplifier circuit has been developed using discrete SiC depletion mode transistors. The amplifier open loop gain decreases by only 4 dB over the temperature range of 298 to 573 K at 1 kHz. From radiation effects results on the discrete devices included in this paper it is expected that this amplifier could survive a severe radiation environment to a total dose of 100 Mrad and neutron fluence exceeding 1015n/cm2. The radiation results also suggest that the amplifier will be less susceptible to radiation at high temperatures. ©1995 American Institute of Physics
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