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A SiC JFET amplifier for operation in high temperature and high radiation environments

 

作者: James M. McGarrity,   Charles J. Scozzie,   James Blackburn,   Bruce Geil,   W. Merle DeLancey,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1995)
卷期: Volume 324, issue 1  

页码: 33-38

 

ISSN:0094-243X

 

年代: 1995

 

DOI:10.1063/1.47186

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A SiC high temperature amplifier circuit has been developed using discrete SiC depletion mode transistors. The amplifier open loop gain decreases by only 4 dB over the temperature range of 298 to 573 K at 1 kHz. From radiation effects results on the discrete devices included in this paper it is expected that this amplifier could survive a severe radiation environment to a total dose of 100 Mrad and neutron fluence exceeding 1015n/cm2. The radiation results also suggest that the amplifier will be less susceptible to radiation at high temperatures. ©1995 American Institute of Physics

 

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