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The effect of minor constituents on the electrotransport‐induced failure site in thin gold films

 

作者: R. E. Hummel,   B. K. Krumeich,   R. T. DeHoff,  

 

期刊: Applied Physics Letters  (AIP Available online 1978)
卷期: Volume 33, issue 11  

页码: 960-962

 

ISSN:0003-6951

 

年代: 1978

 

DOI:10.1063/1.90217

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The presence of small amounts of some solute elements in gold thin films causes a reversal of the failure site during an electrotransport experiment. The effectiveness of a solute element in accomplishing this reversal is not correlated with melting point, solubility, or atomic radius. However, solute elements that produced a reversal in gold films (sodium, indium, barium) all have low ionization energies. Auger electron spectroscopy revealed that sodium from a microscope glass substrate penetrates through a gold film to its free surface during current stressing or during furnace annealing.

 

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