The effect of minor constituents on the electrotransport‐induced failure site in thin gold films
作者:
R. E. Hummel,
B. K. Krumeich,
R. T. DeHoff,
期刊:
Applied Physics Letters
(AIP Available online 1978)
卷期:
Volume 33,
issue 11
页码: 960-962
ISSN:0003-6951
年代: 1978
DOI:10.1063/1.90217
出版商: AIP
数据来源: AIP
摘要:
The presence of small amounts of some solute elements in gold thin films causes a reversal of the failure site during an electrotransport experiment. The effectiveness of a solute element in accomplishing this reversal is not correlated with melting point, solubility, or atomic radius. However, solute elements that produced a reversal in gold films (sodium, indium, barium) all have low ionization energies. Auger electron spectroscopy revealed that sodium from a microscope glass substrate penetrates through a gold film to its free surface during current stressing or during furnace annealing.
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