AUGER EXCITATION BY INTERNAL SECONDARY ELECTRONS
作者:
J. E. Houston,
Robert L. Park,
期刊:
Applied Physics Letters
(AIP Available online 1969)
卷期:
Volume 14,
issue 11
页码: 358-360
ISSN:0003-6951
年代: 1969
DOI:10.1063/1.1652685
出版商: AIP
数据来源: AIP
摘要:
Electron‐excited Auger spectroscopy, as it is presently applied, utilizes incident beam energies which are normally greater than that corresponding to the maximum ionization cross section. Preliminary measurements indicate that Auger emission at these high primary energies is significantly enhanced due to excitation by internal secondary electrons. This creates a serious problem with respect to the use of Auger spectroscopy as an analytical tool.
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