A Microprocessor Based Energy Dispersive X-Ray Diffractometer
作者:
M.K. Sanyal,
V.C. Sahni,
G.P. Das,
期刊:
Instrumentation Science & Technology
(Taylor Available online 1987)
卷期:
Volume 16,
issue 2
页码: 281-294
ISSN:1073-9149
年代: 1987
DOI:10.1080/10739148708543643
出版商: Taylor & Francis Group
数据来源: Taylor
摘要:
A microprocessor based Energy Dispersive X-ray Diffraction system is described. The system is built around three 8085 microprocessors and is suitable for performing rapid structural analysis. It can acquire four spectra in programmable memory banks and can do online data analysis. The software includes a nonlinear least square fitting program, which can fit the complete diffraction pattern at a time. To highlight the data processing capabilities of this system, we have presented the results for a simple solid.
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