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A Microprocessor Based Energy Dispersive X-Ray Diffractometer

 

作者: M.K. Sanyal,   V.C. Sahni,   G.P. Das,  

 

期刊: Instrumentation Science & Technology  (Taylor Available online 1987)
卷期: Volume 16, issue 2  

页码: 281-294

 

ISSN:1073-9149

 

年代: 1987

 

DOI:10.1080/10739148708543643

 

出版商: Taylor & Francis Group

 

数据来源: Taylor

 

摘要:

A microprocessor based Energy Dispersive X-ray Diffraction system is described. The system is built around three 8085 microprocessors and is suitable for performing rapid structural analysis. It can acquire four spectra in programmable memory banks and can do online data analysis. The software includes a nonlinear least square fitting program, which can fit the complete diffraction pattern at a time. To highlight the data processing capabilities of this system, we have presented the results for a simple solid.

 

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