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Photoelectron emission from small particles suspended in air

 

作者: A. Schmidt−Ott,   H. C. Siegmann,  

 

期刊: Applied Physics Letters  (AIP Available online 1978)
卷期: Volume 32, issue 11  

页码: 710-713

 

ISSN:0003-6951

 

年代: 1978

 

DOI:10.1063/1.89915

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Electrical conductivity caused by photoelectron emission from ultrafine particles suspended in a gas has been observed; one obtains information on the concentration as well as on the size of the particles. Furthermore, some bulk and surface properties of small particles not in contact with any substrate can be investigated at any temperature via the photoelectric threshold and the yield of photoelectrons. The method is extremely sensitive, i.e., measurements can be made at a very low particle concentration (∼103cm−3) and small particle radii (<50 A˚).

 

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