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Refractive‐index dispersion of garnet films derived from accurate measurement of film thickness

 

作者: M. J. Sun,  

 

期刊: Applied Physics Letters  (AIP Available online 1978)
卷期: Volume 33, issue 4  

页码: 291-293

 

ISSN:0003-6951

 

年代: 1978

 

DOI:10.1063/1.90342

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Refractive‐index dispersion of magnetic garnet films of composition (YSmLuCa)3(GeFe)5O12is reported in a wavelength range of 0.55–1.5 &mgr;. The dispersion was calculated from the film’s optical interference data and thickness value which was accurately determined by the technique of thin‐film optical waveguide measurement. The calculated index values at the interference fringe locations were fitted to a two‐term Sellmeier formulation. The accuracy was estimated to be better than 0.3%.

 

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