Highly Oriented Pyrolytic Graphite by XPS
作者:
Steven J. Schmieg,
David N. Belton,
期刊:
Surface Science Spectra
(AIP Available online 1992)
卷期:
Volume 1,
issue 4
页码: 333-336
ISSN:1055-5269
年代: 1992
DOI:10.1116/1.1247662
出版商: American Vacuum Society
关键词: GRAPHITE;PHOTOELECTRON SPECTROSCOPY;X RADIATION;CARBON;EEL SPECTROSCOPY;PHOTOEMISSION
数据来源: AIP
摘要:
X-ray photoelectron spectroscopy (XPS) was used to characterize a highly oriented pyrolytic graphite (HOPG) sample. The HOPG was cleaved using scotch tape prior to introduction into an ultrahigh vacuum analytical chamber. No further cleaning was used as no elements other than carbon were detected in XPS survey scans. Electron energy loss spectroscopy (EELS) spectra obtained by x-ray excitation of the C 1slevel can be used as a fingerprint for distinguishing graphite from diamond or carbides [see D. N. Belton and S. J. Schiemg, J. Vac. Technol. A8, 2353 (1990)].
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