A time‐of‐flight analyzer has successfully been used to measure the extracted charge‐state distribution and impurity level of an ECRH mirror plasma. End‐loss temperatures for each ion species have been determined from the rise time of the analyzer output pulses. Ions entering the line‐of‐sight device are first accelerated by a two‐aperture lens and are then focused with an einzel lens. Electrostatic deflection plates chop the ion beam into short pulses which travel down a 1.20‐m tube to an electron multiplier. Ion spectra are typically summed at a rate of 1 kHz using a hardware signal averager.