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Detecting test set hardware degradation using statistical data modelling

 

作者: Randall W. Potter,   George W. Sturm,  

 

期刊: Quality and Reliability Engineering International  （WILEY Available online 1993）
卷期: Volume 9, issue 1  

页码: 63-67

 

ISSN:0748-8017

 

年代: 1993

 

DOI:10.1002/qre.4680090111

 

出版商: Wiley Subscription Services, Inc., A Wiley Company

 

关键词: Hardware degradation;Test set performance;SPC Manufacturing test‐model

 

数据来源: WILEY

 

摘要:

AbstractIn electronic device manufacturing, a significant amount of time is spent testing the product using sophisticated test sets. These test sets routinely develop hardware problems that cause disruption of the manufacturing process. This paper discusses how computerized networking of test sets can be used to systematically monitor and detect these hardware problems. A statistical methodology for modelling and analysing test set data is presented, along with a detailed specific example.

 

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