Observation of grain‐boundary migration using field ion microscopy
作者:
H. C. Eaton,
R. J. Bayuzick,
期刊:
Applied Physics Letters
(AIP Available online 1978)
卷期:
Volume 33,
issue 2
页码: 115-117
ISSN:0003-6951
年代: 1978
DOI:10.1063/1.90303
出版商: AIP
数据来源: AIP
摘要:
The field ion microscope is demonstrated to be a useful tool for studying the motion of grain boundaries in metals. Heating is accomplished by passing a current through a high‐resistance specimen support loop. An example is shown of migration of a grain boundary in tungsten. The radius of curvature at the specimen apex was approximately 12 nm and displacements in the boundary as small as 1 nm are observed.
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