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X‐ray measurements from the jet and ASDEX tokamaks

 

作者: U. Schumacher,   R. Barnsley,   G. Fussmann,   K. Asmussen,   C. C. Chu,   G. Janeschitz,  

 

期刊: AIP Conference Proceedings  (AIP Available online 1992)
卷期: Volume 257, issue 1  

页码: 131-143

 

ISSN:0094-243X

 

年代: 1992

 

DOI:10.1063/1.42484

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The identification of impurities and the investigations into their behaviour in magnetically confined plasmas as well as the plasma parameter determination belong to the most important applications of x‐ray spectroscopy in the JET and ASDEX tokamaks. Broad‐band flat crystal monochromators—supported by impurity monitors and calibration devices—enable impurity concentration and plasma radiation loss measurements over a wide range of atomic numbers, while high‐resolution spectroscopy offers plasma ion temperature and rotation measurements.

 

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