Conversion of the combination EI/FD source supplied by Kratos for the MS-50 mass spectrometer to a combination FD/FAB source is described. Sensitivities in the combination source are equivalent to those of the stand alone FAB source supplied by Kratos and the EI/FD source. Some compounds could be analyzed by FAB only, others by FD only and a third group were susceptible to both techniques. The advantage of the combination source is that both techniques may be used without having to change ion sources or perform extensive instrumental manipulations.