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Continuously displayed emittance measurements

 

作者: J. H. Billen,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1975)
卷期: Volume 46, issue 1  

页码: 33-40

 

ISSN:0034-6748

 

年代: 1975

 

DOI:10.1063/1.1134040

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A device is described to display continuously on a CRT the emittance of an ion beam. The system uses electrostatic deflectors and small apertures to scan the beam’s phase−space position and momentum coordinates. Measurements are reported of the emittance and brightness of the following beams produced by five different ion sources: H−, D−, He+, He−, C−, D2−, O−, NH2−, A+, and Cu−. Also investigated was the emittance of an H−beam from a duoplasmatron direct−extraction source as a function of the radial displacement of thezwischenelectrode, and the phase−space particle density distribution of an H−beam was measured.

 

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