Secondary electron emission from GaAs
作者:
W.A. Gutierrez,
H.D. Pommerrenig,
S.L. Holt,
期刊:
Applied Physics Letters
(AIP Available online 1972)
卷期:
Volume 21,
issue 6
页码: 249-250
ISSN:0003-6951
年代: 1972
DOI:10.1063/1.1654364
出版商: AIP
数据来源: AIP
摘要:
Secondary emission measurements have been made on thick and thin epitaxially grownp‐doped GaAs. Reflection mode gains of 400 at primary voltages of 20 kV have been observed for unthinned layers. The variation of gain with white‐light photoresponse has also been measured. For 5‐&mgr;‐thick self‐supporting layers, a gain of 115 and 30 (at 10 kV primary voltage) has been measured for the reflection and transmission modes, respectively. The escape depth is estimated to be 2 &mgr; with an escape probability of 0.14.
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