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Elliptical spectrograph/gated microchannel‐plate detector for time‐resolved spectral measurements in the x‐ray region

 

作者: B. A. Hammel,   L. E. Ruggles,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1988)
卷期: Volume 59, issue 8  

页码: 1828-1830

 

ISSN:0034-6748

 

年代: 1988

 

DOI:10.1063/1.1140073

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Time‐resolved measurements from an elliptical crystal spectrograph are used to diagnose x‐ray laser experiments on a gas puff Z pinch. The elliptical spectrograph (1.2‐m working distance, eccentricity 0.9586) observes the 1‐keV region, covering a range of &lgr;/2d= 0.5 to 0.9. A thin filter (0.2 &mgr;m Al on 2 &mgr;m Kimfol) stretched across the spectrograph exit slit acts as a low‐energy x‐ray cutoff and as a vacuum window, allowing the detector to be at high vacuum regardless of the pressure in the experimental chamber. The detector consists of a seven‐frame microchannel‐plate intensifier system. A pulser is used to gate each of seven striplines on the microchannel plate, providing nanosecond resolution. With this instrument we are able to measure the pump radiation from the imploding plasma (Ne or Ar) and converter layer (Al), and to study the lasant ionization state (Ne‐like Ni or Cu).

 

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