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High‐resolution Hgl2x‐ray spectrometers

 

作者: S. P. Swierkowski,   G. A. Armantrout,   R. Wichner,  

 

期刊: Applied Physics Letters  (AIP Available online 1973)
卷期: Volume 23, issue 5  

页码: 281-282

 

ISSN:0003-6951

 

年代: 1973

 

DOI:10.1063/1.1654889

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Several high‐resolution HgI2x‐ray detectors have been made from single crystals grown from the vapor phase. Hole and electron transport properties and detector electrical characteristics are described. Measured mobility‐lifetime product for electrons is 8×10−5cm2/V with a &mgr;eof 3 cm2/V sec. The mean energy per electron‐hole pair is 4.33 eV at 122 keV. Detectors up to 1 mm3are described, and a resolution as low as 850 eV at 300 °K in air has been obtained for 5.9‐keV x rays, which suggests possible x‐ray flourescence detection applications.

 

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