Concentric tube scanning tunneling microscope
作者:
C. W. Snyder,
A. L. de Lozanne,
期刊:
Review of Scientific Instruments
(AIP Available online 1988)
卷期:
Volume 59,
issue 4
页码: 541-544
ISSN:0034-6748
年代: 1988
DOI:10.1063/1.1139883
出版商: AIP
数据来源: AIP
摘要:
A small scanning tunneling microscope (STM) for studying surfaces in ultrahigh vacuum is described. It has been designed to have a mechanical tip–sample gap instability of less than 0.002 Å while operating in an environment with relatively large‐amplitude, low‐frequency vibrations. Thermal fluctuations are minimized by built‐in thermal compensation. The microscope has a unique coarsezpositioner, and an open design for accommodating various types of tip and sample exchanging manipulators. A novel mechanism for fabricating tips of the same length makes it possible to approach the tip and sample without visual access. Atomic‐scale images of graphite have been obtained and are presented.
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