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Concentric tube scanning tunneling microscope

 

作者: C. W. Snyder,   A. L. de Lozanne,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1988)
卷期: Volume 59, issue 4  

页码: 541-544

 

ISSN:0034-6748

 

年代: 1988

 

DOI:10.1063/1.1139883

 

出版商: AIP

 

数据来源: AIP

 

摘要:

A small scanning tunneling microscope (STM) for studying surfaces in ultrahigh vacuum is described. It has been designed to have a mechanical tip–sample gap instability of less than 0.002 Å while operating in an environment with relatively large‐amplitude, low‐frequency vibrations. Thermal fluctuations are minimized by built‐in thermal compensation. The microscope has a unique coarsezpositioner, and an open design for accommodating various types of tip and sample exchanging manipulators. A novel mechanism for fabricating tips of the same length makes it possible to approach the tip and sample without visual access. Atomic‐scale images of graphite have been obtained and are presented.

 

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