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Apparatus for Measuring Frequency Derivatives of Dielectric Functions of Surfaces

 

作者: M. L. Shand,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1969)
卷期: Volume 40, issue 6  

页码: 768-770

 

ISSN:0034-6748

 

年代: 1969

 

DOI:10.1063/1.1684063

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The apparatus described by Jasperson and Schnatterly [Rev. Sci. Instrum.40, 761 (1969)] was modified to allow direct measurement of the derivatives of the optical dielectric functions of solids with respect to wavelength. The modifications are described and measurements of ∂&egr;1/∂&lgr; and ∂&egr;2/∂&lgr; are presented for metallic silver in the wavelength range 3300–4000 Å.

 

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