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Epitaxial C60Film on Si(111) by XPS

 

作者: Richard P. Vasquez,   Ruth A. Brain,   David Ross,   Nai-Chang Yeh,  

 

期刊: Surface Science Spectra  （AIP Available online 1992）
卷期: Volume 1, issue 2  

页码: 242-245

 

ISSN:1055-5269

 

年代: 1992

 

DOI:10.1116/1.1247645

 

出版商: American Vacuum Society

 

关键词: FULLERENES;EPITAXIAL LAYERS;PHOTOEMISSION;ENERGY LOSSES;VALENCE BANDS;GRAIN SIZE;XRD;TEM

 

数据来源: AIP

 

摘要:

High resolution XPS measurements of the C 1s, including energy losses, and the valence band regions are presented for a high quality epitaxial film (average grain size ~70 nm) of C60on a Si (111) substrate. Similar films have also been characterized with x-ray diffraction and transmission electron microscopy.

 

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