Photocapacitance studies of deep‐double‐electron‐trap oxygen in gallium phosphide
作者:
H. Kukimoto,
C.H. Henry,
G.L. Miller,
期刊:
Applied Physics Letters
(AIP Available online 1972)
卷期:
Volume 21,
issue 6
页码: 251-253
ISSN:0003-6951
年代: 1972
DOI:10.1063/1.1654365
出版商: AIP
数据来源: AIP
摘要:
Transitions of the deep O donor in a GaPp‐njunction are studied by photocapacitance. It is found that the O donor may deeply trap either one or two electrons. The four optical absorption cross sections are measured for the two states, and from this information the O concentration profile is determined. The concentration ranges from (4 ± 1) × 1014cm−3on thenside to (1.5 ± 0.2) × 1016cm−3on thepside of the junction depletion layer. It is believed that these measurements represent the first direct determination of the concentration of O donors in GaP.
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