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Grating masks suitable for ion‐beam machining and chemical etching

 

作者: Won‐Tien Tsang,   Shyh Wang,  

 

期刊: Applied Physics Letters  (AIP Available online 1974)
卷期: Volume 25, issue 7  

页码: 415-418

 

ISSN:0003-6951

 

年代: 1974

 

DOI:10.1063/1.1655531

 

出版商: AIP

 

数据来源: AIP

 

摘要:

By using the simultaneous exposure and development technique, high‐resolution relief gratings with periods as small as 2400 Å have been produced which have grooves cleanly developed down to the substrate surface and exposing wide surface stripes with clearly defined, sharp and narrow photoresist ridges. Such gratings are suitable for use as masks in ion‐beam machining and chemical etching. Results of chemically etched gratings into glass substrates with a 5000‐Å period are presented and prospects of obtaining chemically etched gratings with shorter periods are discussed.

 

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