Beam line instrumentation at the AGOR cyclotron
作者:
J. M. Schippers,
O. C. Dermois,
K. Gerbens,
H. H. Kiewiet,
P. A. Kroon,
J. Zijlstra,
期刊:
AIP Conference Proceedings
(AIP Available online 1995)
卷期:
Volume 333,
issue 1
页码: 217-223
ISSN:0094-243X
年代: 1995
DOI:10.1063/1.48042
出版商: AIP
数据来源: AIP
摘要:
Instrumentation for measurements of beam intensity, beam position and beam shape at the beam lines of the AGOR cyclotron is discussed. A non‐intercepting beam current transformer and a capactive pick‐up can be used down to 1 nA beam current. In addition to wire grids (measurement of secondary emission current), a very sensitive non intercepting profile monitor, based on ionization measurements of the residual gas in the beam pipe, is presented. ©1995 American Institute of Physics.
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