首页   按字顺浏览 期刊浏览 卷期浏览 Profile correction to electron temperature and enhancement factor in soft‐x&hyph...
Profile correction to electron temperature and enhancement factor in soft‐x‐ray pulse‐height‐analysis measurements in tokamaks

 

作者: S. Sesnic,   M. Diesso,   K. Hill,   A. Holland,   F. Pohl,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1988)
卷期: Volume 59, issue 8  

页码: 1810-1812

 

ISSN:0034-6748

 

年代: 1988

 

DOI:10.1063/1.1140120

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Because soft‐x‐ray pulse‐height‐analysis spectra contain chordal information, the electron temperature and the radiation intensity (enhancement factor) measurements do not represent the local values. The correction factors for the electron temperature and the enhancement factor as a function of the temperature and density profile parameters and the energy are obtained. The spectrum distortion due to pulse pileup effects is also evaluated. A set of curves is given from which the distortion of the spectrum can be obtained if the electron temperature, the Be filter thickness, and the electronic parameters of the acquisition system are known.

 

点击下载:  PDF (323KB)



返 回