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Measurement of third order nonlinear susceptibilities by surface plasmons

 

作者: Y. J. Chen,   G. M. Carter,  

 

期刊: Applied Physics Letters  (AIP Available online 1982)
卷期: Volume 41, issue 4  

页码: 307-309

 

ISSN:0003-6951

 

年代: 1982

 

DOI:10.1063/1.93516

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have developed a novel technique which utilizes the intensity‐dependent dispersion relation of surface plasmons to study the third order nonlinear susceptibility coefficient &khgr;(3). This new technique yields information about both the magnitude and the sign (with respect to &khgr;(1)) of &khgr;(3). Experimental results are reported for GaAs and Si at input wavelengths of 1.05 and 1.11 &mgr;m, respectively.

 

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