Measurement of third order nonlinear susceptibilities by surface plasmons
作者:
Y. J. Chen,
G. M. Carter,
期刊:
Applied Physics Letters
(AIP Available online 1982)
卷期:
Volume 41,
issue 4
页码: 307-309
ISSN:0003-6951
年代: 1982
DOI:10.1063/1.93516
出版商: AIP
数据来源: AIP
摘要:
We have developed a novel technique which utilizes the intensity‐dependent dispersion relation of surface plasmons to study the third order nonlinear susceptibility coefficient &khgr;(3). This new technique yields information about both the magnitude and the sign (with respect to &khgr;(1)) of &khgr;(3). Experimental results are reported for GaAs and Si at input wavelengths of 1.05 and 1.11 &mgr;m, respectively.
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