High quality refractory Josephson tunnel junctions utilizing thin aluminum layers
作者:
M. Gurvitch,
M. A. Washington,
H. A. Huggins,
期刊:
Applied Physics Letters
(AIP Available online 1983)
卷期:
Volume 42,
issue 5
页码: 472-474
ISSN:0003-6951
年代: 1983
DOI:10.1063/1.93974
出版商: AIP
数据来源: AIP
摘要:
Preparation of high quality all‐refractory Josephson tunnel junctions based on Nb/Al‐oxide‐Nb and Nb/Al‐oxide‐Al/Nb structures is reported. Critical currents up to 1300 A/cm2andVmvalues up to 35 mV were obtained. The specific capacitance of these junctions is 0.06±0.02 pF/&mgr;m2. Junctions were fabricated using standard photolithography and a new plasma etching process coupled with anodization of Nb.
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