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Transient analysis of schottky-barrier diodes

 

作者: A.McCowen,   S.B.H.Shaari,   K.Board,  

 

期刊: IEE Proceedings I (Solid-State and Electron Devices)  (IET Available online 1988)
卷期: Volume 135, issue 3  

页码: 71-75

 

年代: 1988

 

DOI:10.1049/ip-i-1.1988.0013

 

出版商: IEE

 

数据来源: IET

 

摘要:

The turnon and turnoff transients of Schottky-barrier diode are determined by analysis based on thermionic emission across the metal-semiconductor barrier and a displacement current within the space charge region. The results of the analysis are compared to those from device simulator and are shown to be in excellent agreement. 10%; time constants for both turnon and turnoff transients are shown to be strongly controlled by the SBDs depletion capacitance reverse bias.

 

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