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LEIT effect in metal‐insulator‐semiconductor tunnel junctions

 

作者: S. L. McCarthy,   John Lambe,  

 

期刊: Applied Physics Letters  (AIP Available online 1978)
卷期: Volume 33, issue 10  

页码: 858-860

 

ISSN:0003-6951

 

年代: 1978

 

DOI:10.1063/1.90214

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Light emission via inelastic tunneling (LEIT) has been observed from the metal‐insulator‐semiconductor tunnel‐junction Al‐Al2O3‐ Sn‐doped indium oxide (ITO). The spectra exhibit the bias‐voltage‐dependent upper‐frequency quantum cutoff relation. These devices were stable at room temperature for months at a time while biased to 3 V. The external quantum efficiency of this metal‐insulator‐semiconductor system is about 0.1 that of the metal‐insulator‐metal system Al‐Al2O3‐Ag. Enhancement of the light emission using silver particle resonators is also reported.

 

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