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Auger Line Shape Comparison of N and S in Two Different Chemical Environments

 

作者: E. N. Sickafus,   F. Steinrisser,  

 

期刊: Journal of Vacuum Science and Technology  (AIP Available online 1973)
卷期: Volume 10, issue 1  

页码: 43-46

 

ISSN:0022-5355

 

年代: 1973

 

DOI:10.1116/1.1318040

 

出版商: American Vacuum Society

 

数据来源: AIP

 

摘要:

Line shapes of Auger electron spectra have been analyzed in the derivative modedN/dEto obtain evidence of chemisorption bond characteristics of sulfur and nitrogen in two different chemical environments. Sulfur in a monolayer surface structure on nickel,Ni(110)–c(2×2)Sis characterized as having a residuald-band and two (molecular orbital) resonances, as first depicted by ion-neutralization spectroscopy; while sulfur in a cleaved surface (112¯0) of CdS displays only filled band properties with no resolvable resonance structure. Nitrogen adsorbed on Ni(110) is characterized by a residuald-band and two resonances: one at ∼12 eV and the other at ∼25 eV below the vacuum zero. The analysis is consistent with data published earlier on a characteristic energy-loss description of Ni(110)-(disordered)N. Nitrogen adsorbed on Si(111) appears to have similar resonances at 13 eV and 27 eV below the vacuum zero with no other intervening band structure.

 

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