Auger Line Shape Comparison of N and S in Two Different Chemical Environments
作者:
E. N. Sickafus,
F. Steinrisser,
期刊:
Journal of Vacuum Science and Technology
(AIP Available online 1973)
卷期:
Volume 10,
issue 1
页码: 43-46
ISSN:0022-5355
年代: 1973
DOI:10.1116/1.1318040
出版商: American Vacuum Society
数据来源: AIP
摘要:
Line shapes of Auger electron spectra have been analyzed in the derivative modedN/dEto obtain evidence of chemisorption bond characteristics of sulfur and nitrogen in two different chemical environments. Sulfur in a monolayer surface structure on nickel,Ni(110)–c(2×2)Sis characterized as having a residuald-band and two (molecular orbital) resonances, as first depicted by ion-neutralization spectroscopy; while sulfur in a cleaved surface (112¯0) of CdS displays only filled band properties with no resolvable resonance structure. Nitrogen adsorbed on Ni(110) is characterized by a residuald-band and two resonances: one at ∼12 eV and the other at ∼25 eV below the vacuum zero. The analysis is consistent with data published earlier on a characteristic energy-loss description of Ni(110)-(disordered)N. Nitrogen adsorbed on Si(111) appears to have similar resonances at 13 eV and 27 eV below the vacuum zero with no other intervening band structure.
点击下载:
PDF
(428KB)
返 回