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Experiment to investigate self-testing techniques in VLSI

 

作者: T.W.Williams,   R.G.Walther,   P.S.Bottorff,   S.Das Gupta,  

 

期刊: IEE Proceedings G (Electronic Circuits and Systems)  （IET Available online 1985）
卷期: Volume 132, issue 3  

页码: 105-107

 

年代: 1985

 

DOI:10.1049/ip-g-1.1985.0022

 

出版商: IEE

 

数据来源: IET

 

摘要:

The paper contains the results of an experiment which observes the capabilities of a linear feedback shift register network, to both generate pseudorandom test patterns and compress the results of a test. Two typical networks from an actual LSI designed machine are used.

 

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