On-chip testing of embedded p.l.a.s
作者:
P.Varma,
A.P.Ambler,
K.Baker,
期刊:
Journal of the Institution of Electronic and Radio Engineers
(IET Available online 1985)
卷期:
Volume 55,
issue 9
页码: 306-310
年代: 1985
DOI:10.1049/jiere.1985.0101
出版商: IERE
数据来源: IET
摘要:
Rising test generation costs, compounded by the problem of module inaccessibility, have led to a surge of interest in self-testing methods for p.l.a.s. This paper considers the problems associated with the on-chip testing of p.l.a.s deeply embedded in v.l.s.i. systems and presents a method of on-chip testing which uses the input/output registers of the p.l.a. as test aids. An 8-input ×45 product term ×6-output built-in testable p.l.a., which has been implemented in n.m.o.s., is described.
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