Simplified mathematical approach to XRF secondary excitation
作者:
C. Bui,
M. Milazzo,
C. Sironi,
期刊:
X‐Ray Spectrometry
(WILEY Available online 1993)
卷期:
Volume 22,
issue 1
页码: 17-22
ISSN:0049-8246
年代: 1993
DOI:10.1002/xrs.1300220106
出版商: Wiley Subscription Services, Inc., A Wiley Company
数据来源: WILEY
摘要:
AbstractA secondary effect simplified mathematical expression (SESME) was developed to calculate, in a very simple way, the XRF enhancement effect by secondary excitation. This approximate methods makes possible the use of a simple algorithm in the case of a finite thickness sample also. The numerical approximations are quantitatively estimated for samples of infinite thickness and the physical meaning of the formal expression is discussed.
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