An ac method of Seebeck coefficient measurement by the use of lasers
作者:
M. Kawai,
K. Tahira,
K. Kitagawa,
T. Miyakawa,
期刊:
Applied Physics Letters
(AIP Available online 1978)
卷期:
Volume 33,
issue 1
页码: 9-10
ISSN:0003-6951
年代: 1978
DOI:10.1063/1.90161
出版商: AIP
数据来源: AIP
摘要:
The frequency dependence of thermoelectric power and the resistivity change induced by the infrared radiation from a chopped laser beam is used to estimate the Seebeck coefficient of semiconductor samples. The use of data on temperature dependence of resistivity eliminates the need for the measurement of rapidly varying temperature and its gradient within the sample. The method is tested forp‐Ge samples and good agreement is obtained with the results of usual dc measurement.
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