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Acoustic‐emission study of defects in GaP light‐emitting diodes

 

作者: T. Ikoma,   M. Ogura,   Y. Adachi,  

 

期刊: Applied Physics Letters  （AIP Available online 1978）
卷期: Volume 33, issue 5  

页码: 414-415

 

ISSN:0003-6951

 

年代: 1978

 

DOI:10.1063/1.90397

 

出版商: AIP

 

数据来源: AIP

 

摘要:

Acoustic emission was detected during the degradation of GaP : N light‐emitting diodes and was shown to have a correlation with the generation of dislocations near thep‐n‐junction plane. This technique provides us with a powerful tool to investigate dislocation motion on real time and in a nondestructive way.

 

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