EPR characterization of optical‐quality AgGaS2grown from the melt
作者:
H. J. von Bardeleben,
A. Goltzene´,
C. Schwab,
R. S. Feigelson,
期刊:
Applied Physics Letters
(AIP Available online 1978)
卷期:
Volume 32,
issue 11
页码: 741-744
ISSN:0003-6951
年代: 1978
DOI:10.1063/1.89906
出版商: AIP
数据来源: AIP
摘要:
The EPR study of optical‐quality AgGaS2has proven the existence of the point defects Ni3+, Fen+, (n⩽2), a shallow donor (ED<0.11 eV), and one associated defect Fe3+‐X, the charge states of which are all photosensitive. The effectiveness of the standard annealing procedures, employed to obtain crystals of low absorption in the 0.5–12‐&mgr;m range, is associated with an oxidation of these transition‐metal impurities.
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