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EPR characterization of optical‐quality AgGaS2grown from the melt

 

作者: H. J. von Bardeleben,   A. Goltzene´,   C. Schwab,   R. S. Feigelson,  

 

期刊: Applied Physics Letters  (AIP Available online 1978)
卷期: Volume 32, issue 11  

页码: 741-744

 

ISSN:0003-6951

 

年代: 1978

 

DOI:10.1063/1.89906

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The EPR study of optical‐quality AgGaS2has proven the existence of the point defects Ni3+, Fen+, (n⩽2), a shallow donor (ED<0.11 eV), and one associated defect Fe3+‐X, the charge states of which are all photosensitive. The effectiveness of the standard annealing procedures, employed to obtain crystals of low absorption in the 0.5–12‐&mgr;m range, is associated with an oxidation of these transition‐metal impurities.

 

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