Resonant cavities for the measurement of the surface resistance of conductors at millimeter wavelengths
作者:
F. J. Tischer,
F. Jalali,
期刊:
Review of Scientific Instruments
(AIP Available online 1975)
卷期:
Volume 46,
issue 1
页码: 11-14
ISSN:0034-6748
年代: 1975
DOI:10.1063/1.1134054
出版商: AIP
数据来源: AIP
摘要:
Three cavity resonators for the investigation of the electrical surface characteristics of conductors at millimeter−wave frequencies are described. They are anH−guide resonator and two rectangular cavity resonators optimized to give high accuracy and good repeatability of measurements. The investigation in which these cavities are used involvesQ−value measurements at 35 Ghz with polished and rough surfaces.
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