Operational life testing of power transistors switching unclamped inductive loads
作者:
G. L. White,
期刊:
Quality and Reliability Engineering International
(WILEY Available online 1994)
卷期:
Volume 10,
issue 1
页码: 63-69
ISSN:0748-8017
年代: 1994
DOI:10.1002/qre.4680100110
出版商: Wiley Subscription Services, Inc., A Wiley Company
关键词: Operational life testing;Case history;Second breakdown;Stress circuit;Transistor
数据来源: WILEY
摘要:
AbstractThis paper describes three types of high voltage power transistors that are in widespread use in the electronics industry today, and their susceptibility to reverse‐biased second breakdown while switching unclamped inductive loads. It provides a brief explanation of the phenomenon of second breakdown in transistors under both forward‐biased and reverse‐biased conditions. It describes a stress circuit that has been developed to incorporate switching of unclamped inductive loads as an integral part of operational life testing. A case history incorporating this technique is presented for the 2SD1739 high voltageNPNbipolar power trans
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