Infrared optical constants of PtSi
作者:
J. M. Pimbley,
W. Katz,
期刊:
Applied Physics Letters
(AIP Available online 1983)
卷期:
Volume 42,
issue 11
页码: 984-986
ISSN:0003-6951
年代: 1983
DOI:10.1063/1.93823
出版商: AIP
数据来源: AIP
摘要:
Knowledge of the infrared optical constants of PtSi is required for quantum yield calculations of Schottky barrier IR imagers with PtSi electrodes. We employ Rutherford backscattering spectrometry to identify the PtSi phase and calculate the infrared optical constants from reflectance data by a Kramers–Kronig analysis technique. Several examples of quantum yield calculations for different imager structures using the calculated optical constants are given.
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