Epitaxial growth of deposited amorphous layer by laser annealing
作者:
S. S. Lau,
W. F. Tseng,
M‐A. Nicolet,
J. W. Mayer,
R. C. Eckardt,
R. J. Wagner,
期刊:
Applied Physics Letters
(AIP Available online 1978)
卷期:
Volume 33,
issue 2
页码: 130-131
ISSN:0003-6951
年代: 1978
DOI:10.1063/1.90280
出版商: AIP
数据来源: AIP
摘要:
We demonstrate that a single short pulse of laser irradiation of appropriate energy is capable of recrystallizing in open air an amorphous Si layer deposited on a (100) single‐crystal substrate into an epitaxial layer. The laser pulse annealing technique is shown to overcome the interfacial oxide obstacle which usually leads to polycrystalline formation in normal thermal annealing.
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