In this work we report measurements of the electronic density and electronic temperature in a pulsed plasma system by using a double probe. We have implemented an automatic system of measure that start from the bias of a double electrostatic probe, allows us to register the complete curves of current-voltage in times of order of 10 ms; The electron density and electronic temperature can be extracted from the current-voltage I(V) characteristic. The advantage of this technique is that it allows us to get “in situ” quantity of information that when comparing them with the theoretical results using numeric methods for its simulation, provide us the necessary fits to quantify these parameters. ©2001 American Institute of Physics.