首页   按字顺浏览 期刊浏览 卷期浏览 Combination of a scanning tunneling microscope with a scanning electron microscope
Combination of a scanning tunneling microscope with a scanning electron microscope

 

作者: L. Va´zquez,   A. Bartolome´,   R. Garci´a,   A. Buendi´a,   A. M. Baro´,  

 

期刊: Review of Scientific Instruments  （AIP Available online 1988）
卷期: Volume 59, issue 8  

页码: 1286-1289

 

ISSN:0034-6748

 

年代: 1988

 

DOI:10.1063/1.1139710

 

出版商: AIP

 

数据来源: AIP

 

摘要:

We have placed a scanning tunneling microscope (STM) in the sample stage of a scanning electron microscope (SEM). This allows us to focus the tip on a preselected spot for STM operation with a precision of 0.5 &mgr;m. We are able to check the state of the sample and the tip during STM operation by simultaneous use of the SEM. We are also able to correlate the images given by both techniques.

 

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