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FORWARD CURRENT‐VOLTAGE CHARACTERISTICS AND DIFFERENTIAL RESISTANCE PEAK OF A SCHOTTKY BARRIER DIODE ON HEAVILY DOPED SILICON

 

作者: A. N. Saxena,  

 

期刊: Applied Physics Letters  (AIP Available online 1969)
卷期: Volume 14, issue 1  

页码: 11-13

 

ISSN:0003-6951

 

年代: 1969

 

DOI:10.1063/1.1652637

 

出版商: AIP

 

数据来源: AIP

 

摘要:

An analysis of the forward current‐voltage data for a temperature range of 77.2° to 423°K on a Cr&sngbnd;Si (ND= 7 × 1018cm−3) Schottky barrier diode is given. TheI‐Vbehavior of such a diode, which obviously does not follow the simple Schottky theory, is not explained by the more recent calculations of Padovani and Stratton, and of Crowell and Rideout in which field emission is taken into account. It is observed that the peak in differential resistance and its variation with voltage on such a diode is in reasonable agreement with the theories of Stratton and Padovani, and of Crowell and Rideout.

 

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