Quantitative X‐ray phase analysis of surface layers
作者:
L. S. Zevin,
P. Rozenak,
D. Eliezer,
期刊:
Journal of Applied Crystallography
(WILEY Available online 1984)
卷期:
Volume 17,
issue 1
页码: 18-21
ISSN:1600-5767
年代: 1984
DOI:10.1107/S0021889884010931
出版商: International Union of Crystallography
数据来源: WILEY
摘要:
The proposed method is aimed at the analysis of phase distribution in thin surface layers comparable to the penetration depth of X‐rays. The phase distribution is modelled mathematically and the parameters of the distribution are evaluated from diffraction data taken for various peaks and with various radiations. The method was applied to the analysis of austenite distribution in cathodically charged stainless stee
点击下载:
PDF
(388KB)
返 回