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Confocal surface acoustic wave microscopy

 

作者: I. R. Smith,   H. K. Wickramasinghe,   G. W. Farnell,   C. K. Jen,  

 

期刊: Applied Physics Letters  (AIP Available online 1983)
卷期: Volume 42, issue 5  

页码: 411-413

 

ISSN:0003-6951

 

年代: 1983

 

DOI:10.1063/1.93958

 

出版商: AIP

 

数据来源: AIP

 

摘要:

When the scanning acoustic microscope is used in a defocussed mode to measure surface acoustic wave properties, circular surface wave fronts are generated on the specimen which propagate to a diffraction‐limited focus. Thus, high resolution surface wave images are simply formed and a wide range of established nondestructive testing techniques become available to the acoustic microscope. Images obtained in the reflection mode are presented which demonstrate the unexpectedly high spatial resolution.

 

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