Confocal surface acoustic wave microscopy
作者:
I. R. Smith,
H. K. Wickramasinghe,
G. W. Farnell,
C. K. Jen,
期刊:
Applied Physics Letters
(AIP Available online 1983)
卷期:
Volume 42,
issue 5
页码: 411-413
ISSN:0003-6951
年代: 1983
DOI:10.1063/1.93958
出版商: AIP
数据来源: AIP
摘要:
When the scanning acoustic microscope is used in a defocussed mode to measure surface acoustic wave properties, circular surface wave fronts are generated on the specimen which propagate to a diffraction‐limited focus. Thus, high resolution surface wave images are simply formed and a wide range of established nondestructive testing techniques become available to the acoustic microscope. Images obtained in the reflection mode are presented which demonstrate the unexpectedly high spatial resolution.
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