首页   按字顺浏览 期刊浏览 卷期浏览 Microwave Hall measurment techniques on low mobility semiconductors and insulators. I. ...
Microwave Hall measurment techniques on low mobility semiconductors and insulators. I. Analysis

 

作者: Mohamed M. Sayed,   Charles R. Westgate,  

 

期刊: Review of Scientific Instruments  (AIP Available online 1975)
卷期: Volume 46, issue 8  

页码: 1074-1079

 

ISSN:0034-6748

 

年代: 1975

 

DOI:10.1063/1.1134404

 

出版商: AIP

 

数据来源: AIP

 

摘要:

The relationships of microwave Hall mobilities and microwave conductivities in a semiconductor, placed at the center of a dual mode TE111cavity, are expressed in terms of the loaded and unloaded voltage reflection coefficients, the sample and the cavity dimensions, the ratio of the output power to the input power of the cavity, and the magnetic field. Scattering

 

点击下载:  PDF (388KB)



返 回