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Measurement of surface contamination using oxygen‐ion‐induced x rays

 

作者: M.J. Saltmarsh,   A. van der Woude,   C.A. Ludemann,  

 

期刊: Applied Physics Letters  （AIP Available online 1972）
卷期: Volume 21, issue 2  

页码: 64-67

 

ISSN:0003-6951

 

年代: 1972

 

DOI:10.1063/1.1654281

 

出版商: AIP

 

数据来源: AIP

 

摘要:

X rays induced by 20‐MeV oxygen ions have been used to search for trace quantities of lanthanum on the surface of a NaCl crystal. The results demonstrate the sensitivity of the method to small quantities of heavy elements present on low‐Zmatrices.

 

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