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Determination of AlxGa1‐xAs bandgap by Schottky barrier spectral response measurement

 

作者: Hao‐Hsiung Lin,   Si‐Chen Lee,  

 

期刊: Journal of the Chinese Institute of Engineers  (Taylor Available online 1986)
卷期: Volume 9, issue 3  

页码: 317-322

 

ISSN:0253-3839

 

年代: 1986

 

DOI:10.1080/02533839.1986.9676894

 

出版商: Taylor & Francis Group

 

关键词: AlGaAs;Schottky barrier

 

数据来源: Taylor

 

摘要:

TheG1c–G15vbandgap of the AlxGa1–xAs compound semiconductor withxranging from 0.06 to 0.87 was determined by fitting their Schottky barrier spectral response with a device model. Since the spectral response near the AlxGa1_xAs bandgap is proportional to its absorption coefficient, the bandgap could also be obtained by direct extrapolation of the square response versus photon energy curve to zero response. Both results are shown to be in good agreement. Using samples withxlarger than 0.48, we could also observe additional responses originated fromG15vtoX1candL1cindirect transitions. By using least‐squared fit we obtained not only theXband but also theLband energies. The electrolyte electroreflectance method was also applied to measure the direct bandgap of those samples withxranging from 0.06 to 0.59, and gave similar results.

 

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