A double‐crystal x‐ray spectrometer designed for in‐laboratory EXAFS (extended x‐ray absorption fine structure) study is described. By the use of two curved crystals with different structure factors such as Ge(220) and Ge(111), reflections other than the desired order are virtually eliminated and monochromatic as well as intense x‐ray flux can be obtained by applying higher voltage to the x‐ray generator. As a result, data of very high quality can be collected in a short period by measuring the incident and the transmitted beam intensity simultaneously. It can cover a wide spectral range (7–26 keV) and is especially useful in the high‐energy region, where the laboratory EXAFS system previously reported has some difficulties.