Small angle scattering is a wellestablished technique used to characterize structures ranging from nanoscopic (1 nm) to microscopic (a few microns) scales. A combination of small angle X-ray scattering (SAXS) and small angle neutron scattering (SANS) provides complementary (contrast) structural information in a myriad of systems belonging to hard and soft, as well as biological, matter. From February 12–13, 1999, a joint ESRF-ILL-CEA workshop was held at the ILL and organized by T. Zemb (CEA-Saclay), B. Demt (ILL), 0. Diat (CEA, Grenoble), and T. Narayanan (ESRF). The purpose of this workshop was to provide a comprehensive overview of the state-of-the-art instruments existing at ESRF and ILL to the current and prospective users.